能譜透射電鏡 Talos F200S TEM
- 公司名稱 賽默飛世爾科技（中國）有限公司
- 品牌 FEI/賽默飛
- 型號
- 產地
- 廠商性質 生產廠家
- 更新時間 2025/3/21 10:50:39
- 訪問次數 304
聯系方式：賽默飛世爾科技021-60355786 查看聯系方式
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| 價格區間 | 面議 | 儀器種類 | 熱場發射 |
|---|---|---|---|
| 應用領域 | 環保,化工 |
能譜透射電鏡 Talos F200S TEM
能譜透射電鏡 Talos F200S TEM TEM microscope for high productivity, high resolution TEM and STEM characterization with chemical quantification
Talos F200S G2 Transmission Electron Microscope
The Thermo Scientific Talos F200S (S)TEM is a (scanning) transmission electron microscope that combines outstanding high-resolution STEM and TEM imaging with industry-leading energy dispersive X-ray spectroscopy (EDS). The Talos F200S (S)TEM features great versatility and high through in STEM imaging and allows for precise EDS analysis and high-resolution TEM (HRTEM) for dynamic microscopy.
Talos F200S G2 Transmission Electron Microscope advantages
The Thermo Scientific Talos F200S 200kV (S)TEM combines fast, multichannel, high-resolution (S)TEM imaging and precise compositional analysis to enable dynamic microscopy applications. With innovative features designed to increase throughput, precision, and ease of use, the Talos (S)TEM is ideal for advanced research and analysis across academic, government, and industrial research environments.
Talos F200S G2 Transmission Electron Microscope features
Intuitive software
Features Thermo Scientific Velox Software for fast and easy acquisition and analysis of multimodal data.
Upgrade
Can be field upgraded to the Thermo Scientific Talos F200X (S)TEM.
Precise chemical composition data
Rapid, precise, quantitative EDS analysis using two in-column Thermo Scientific SDD Super-X Detectors with unique cleanliness, revealing nanoscale details.
Increased stability
Reduced environmental sensitivity thanks to the instrument enclosure, which moderates the impact of air pressure waves, air flows, and fine temperature variations in the TEM room.
Better image data
High-throughput (S)TEM imaging with simultaneous, multiple signal detection delivers better contrast for high quality images.
Space for more
Add application-specific in situ sample holders for dynamic experiments.
Specifications
| HRTEM line resolution |
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| HRSTEM [nm] |
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| Total beam current FEG |
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| EDS system |
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| EDS energy resolution |
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| Fast EDS mapping |
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| EDS Net solid angle |
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